Total-dose and SEU characterization of 0.25 micron CMOS/SOI integrated circuit memory technologies
نویسندگان
چکیده
منابع مشابه
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OF THESIS Submitted in Partial Fulfillment of the Requirements for the Degree of Master of Science Electrical Engineering The University of New Mexico Albuquerque, New Mexico
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ژورنال
عنوان ژورنال: IEEE Transactions on Nuclear Science
سال: 1997
ISSN: 0018-9499,1558-1578
DOI: 10.1109/23.659028